SEM – Essential in Daily Lab Operation – JSM-IT700HR Makes it Easy
TOKYO -Tuesday 4 August 2020 [ AETOS Wire ]
(BUSINESS
WIRE)-- JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces
the release of a new scanning electron microscope (SEM), the
JSM-IT700HR for unprecedentedly high throughput in August 2020.
Development background
Scanning
electron microscopes are used in various fields, such as
nanotechnology, metals, semiconductors, ceramics, medicine, and biology.
In addition, SEM applications are expanding to include quality control
as well as basic research. The demands are increasing for faster data
acquisition of higher-quality SEM images and for easier confirmation of
compositional information.
Based on our award-winning predecessor
of “InTouchScope™” series SEMs, the JSM-IT700HR is equipped with our
in-lens Schottky field emission electron gun (FEG). This new powerful
SEM satisfies the needs for observation and analysis of further
miniaturized materials in daily laboratory operation.
The
JSM-IT700HR delivers a high resolution of 1 nm and a maximum probe
current of 300 nA (15 times higher than previously), providing a wealth
of observation and analysis information. A simple-to-operate user
interface, the compact design accommodating a large specimen chamber,
with a renewed anti-vibrational support for the main console achieve
more comfortable observation and analysis than before.
For
enhancing “Simple operation,” the JSM-IT700HR incorporates a new
function, integrated into the SEM GUI, to display the characteristic
X-ray generation depth. This supports prompt understanding of the
analysis depth (reference) for the specimen, which is useful for
elemental analysis.
2 configurations are available, 1)
JSM-IT700HR/LV for high and low vacuum image observation, 2)
JSM-IT700HR/LA with additional integrated JEOL EDS system.
Features
The in-lens Schottky field emission electron gun allows for
high-definition image observation and high spatial-resolution analysis.
The Zeromag function, which links Holder Graphics, CCD and SEM images, makes specimen navigation easier than ever.
With our “Analytical series” (Live Analysis function), the embedded EDS
system shows a real-time EDS spectrum during image observation for
efficient elemental analysis.
A new function to display the analysis depth (characteristic X-ray generation depth) supports fast elemental analysis.
SMILE VIEW™ Lab, enabling integrated management of image and analysis
data, facilitates report generation for all data from collected SEM
images to elemental analysis results.
“Specimen Exchange Navi” enables safe and simple specimen exchange.
With the Auto Beam Alignment function, the electron optical conditions are always kept optimum.
“Drawout exchange system” allows easy access to the large specimen
chamber, which accommodates various sizes and types of specimens
Sales target
130 units/year (initial year)
URL: https://www.jeol.co.jp/en/products/detail/JSM-IT700HR.html
JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & COO
(Stock code: 6951, Tokyo Stock Exchange First Section)
www.jeol.com
View source version on businesswire.com: https://www.businesswire.com/news/home/20200803005011/en/
Contacts
JEOL Ltd.
Science and Measurement Instruments Sales Division
Yoshiki YAMASAKI
+81-3-6262-3567
https://www.jeol.co.jp/en/support/support_system/contact_products.html
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